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Silicon-Controlled Rectifier for Electrostatic Discharge Protection Solutions With Minimal Snapback and Reduced Overshoot Voltage
An electrostatic discharge (ESD) protection structure constructed by the stacking of multiple anode gate-cathode gate directly connected silicon-controlled rectifiers (DCSCRs), fabricated in a 0.18-μm CMOS technology is reported in this letter. Two embedded diodes in the DCSCR dictate the turn-ON mechanism and hence give rise to a trigger voltage equal to twice the diode"s turn-ON voltage. This approach enables the DCSCR to offer a diode-like transmission line pulsing IV characteristic with a minimal snapback and a SCR-like high-ESD robustness. At 25 °C, DCSCR has an acceptable nanoampere-level leakage current. Besides, it is verified that the DCSCR can significantly reduce overshoot voltage when stressed by very-fast-rising pulses. As such, an ESD clamp constructed by stacking a selected number of DCSCRs can offer a flexible trigger/holding voltage and is suitable for low and medium voltage ESD protection applications.
**作者:**Sun Ruei-Cheng,Wang Zhixin,Klebanov Maxim,Liang Wei,Liou Juin J.,Liu Don-Gey
**出版年份:**2015
**期刊/影响因子:**IEEE Electron Device Letters/
**数字对象唯一标识符DOI:**10.1109/LED.2015.2413844
一种新型二极管触发的SCR器件的各种性能
略
0.18um CMOS Process
从Fig. 5可以看出来这个器件的过冲相当的小,比二极管的过冲更小,关键是这个器件的It2还比二极管的It2要大。
替代二极管的好器件!
低压领域(和正向级联二极管基本相同的触发电压,但是却能提供高的多的It2)
CDM防护(这个器件的触发速度非常快,从其VFTLP测试数据来看其过冲甚至比Diode的过冲都要小,很适合对CDM的有效防护)
本文开发了一种采用 0.18 μmCMOS 技术实现的新型 SCR 结构。该结构采用 DCSCR 作为单元,它是一个 SCR,其阳极栅极和阴极栅极连接在一起形成两个嵌入式二极管,从而形成一个内部触发路径,触发电压约为 1.3 V,接近零的回跳电压窗口和低寄生电容。它具有良好的热漏电流性能,在 25 °C 时具有可接受的 nA 水平。
DCSCR由嵌入式二极管内部触发,可有效将过冲电压降低至5.1V,峰值电压远低于栅氧化层击穿电压。对于低压和中压 ESD 应用,采用堆叠 DCSCR 构建的 ESD 钳位已证明可以在目标设计窗口内成功运行,从而为低压和中压 ESD 应用提供有吸引力且灵活的解决方案。
这个结构不能不说很天才!
需要注意的是这个器件的漏电是其一大缺点,尤其是在高温下的漏电。